{"id":2072,"date":"2026-04-02T05:49:54","date_gmt":"2026-04-02T05:49:54","guid":{"rendered":"https:\/\/www.zmsh-semitech.com\/?p=2072"},"modified":"2026-04-02T05:54:11","modified_gmt":"2026-04-02T05:54:11","slug":"in-depth-analysis-of-the-eight-major-segments-of-semiconductor-equipment","status":"publish","type":"post","link":"https:\/\/www.zmsh-semitech.com\/hu\/in-depth-analysis-of-the-eight-major-segments-of-semiconductor-equipment\/","title":{"rendered":"A f\u00e9lvezet\u0151 berendez\u00e9sek nyolc f\u0151 szegmens\u00e9nek r\u00e9szletes elemz\u00e9se"},"content":{"rendered":"<p>A f\u00e9lvezet\u0151gy\u00e1rt\u00f3 ipar a fejlett integr\u00e1lt \u00e1ramk\u00f6r\u00f6k gy\u00e1rt\u00e1s\u00e1hoz rendk\u00edv\u00fcl speci\u00e1lis berendez\u00e9sek sz\u00e9les sk\u00e1l\u00e1j\u00e1ra t\u00e1maszkodik. Ez a cikk a k\u00f6vetkez\u0151 nyolc kritikus kateg\u00f3ri\u00e1r\u00f3l ny\u00fajt \u00e1ttekint\u00e9st <a href=\"https:\/\/www.zmsh-semitech.com\/hu\/products\/\"><mark style=\"background-color:rgba(0, 0, 0, 0);color:#0693e3\" class=\"has-inline-color\">f\u00e9lvezet\u0151 berendez\u00e9sek<\/mark><\/a>, megvizsg\u00e1lva azok funkci\u00f3it, technol\u00f3giai jelent\u0151s\u00e9g\u00e9t \u00e9s az ipar\u00e1gi trendeket.<\/p>\n\n\n\n<figure class=\"wp-block-image aligncenter size-full\"><img fetchpriority=\"high\" decoding=\"async\" width=\"1000\" height=\"650\" src=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/In-Depth-Analysis-of-the-Eight-Major-Segments-of-Semiconductor-Equipment.jpg\" alt=\"\" class=\"wp-image-2073\" srcset=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/In-Depth-Analysis-of-the-Eight-Major-Segments-of-Semiconductor-Equipment.jpg 1000w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/In-Depth-Analysis-of-the-Eight-Major-Segments-of-Semiconductor-Equipment-300x195.jpg 300w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/In-Depth-Analysis-of-the-Eight-Major-Segments-of-Semiconductor-Equipment-768x499.jpg 768w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/In-Depth-Analysis-of-the-Eight-Major-Segments-of-Semiconductor-Equipment-18x12.jpg 18w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/In-Depth-Analysis-of-the-Eight-Major-Segments-of-Semiconductor-Equipment-600x390.jpg 600w\" sizes=\"(max-width: 1000px) 100vw, 1000px\" \/><\/figure>\n\n\n\n<h3 class=\"wp-block-heading\">1. Litogr\u00e1fiai berendez\u00e9sek<\/h3>\n\n\n\n<p>A litogr\u00e1fiai g\u00e9pek a f\u00e9lvezet\u0151gy\u00e1rt\u00e1s sarokk\u00f6vei. A litogr\u00e1fiai elj\u00e1r\u00e1s hat\u00e1rozza meg a chipek legkisebb jellemz\u0151m\u00e9ret\u00e9t, \u00e9s k\u00f6zvetlen\u00fcl meghat\u00e1rozza a folyamatcsom\u00f3pontokat \u00e9s az eszk\u00f6z teljes\u00edtm\u00e9ny\u00e9t. A fejlett chipek gyakran 60-90 litogr\u00e1fiai l\u00e9p\u00e9st ig\u00e9nyelnek, \u00e9s a litogr\u00e1fia a gy\u00e1rt\u00e1si k\u00f6lts\u00e9gek nagyj\u00e1b\u00f3l 30%-\u00e9rt, valamint a teljes feldolgoz\u00e1si id\u0151 40-50%-\u00e9rt felel\u0151s.<\/p>\n\n\n\n<p>A litogr\u00e1fiai rendszer jellemz\u0151en f\u00e9nyforr\u00e1sb\u00f3l, egyenletes megvil\u00e1g\u00edt\u00e1si optik\u00e1b\u00f3l, vet\u00edt\u0151lencs\u00e9kb\u0151l, valamint prec\u00edzi\u00f3s mechanikai \u00e9s vez\u00e9rl\u0151rendszerekb\u0151l \u00e1ll, bele\u00e9rtve az ostyaszelet-\u00e1llv\u00e1nyokat \u00e9s a maszkigaz\u00edt\u00f3kat. A f\u00e9lvezet\u0151k \u00f6sszetetts\u00e9g\u00e9nek n\u00f6veked\u00e9s\u00e9vel a litogr\u00e1fiai rendszerek hazai gy\u00e1rt\u00e1sa m\u00e9g mindig korl\u00e1tozott, \u00e9s a piac nagy r\u00e9sze import\u00e1lt berendez\u00e9sekre t\u00e1maszkodik. A jelenlegi fejleszt\u00e9si er\u0151fesz\u00edt\u00e9sek a kisebb node-ok \u00e9s a nagyobb pontoss\u00e1g el\u00e9r\u00e9s\u00e9re \u00f6sszpontos\u00edtanak, a mer\u00fcl\u0151 litogr\u00e1fiai technol\u00f3gi\u00e1k ter\u00e9n el\u00e9rt folyamatos fejl\u0151d\u00e9ssel.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">2. Metsz\u0151 berendez\u00e9sek<\/h3>\n\n\n\n<p>A marat\u00e1s az \u00e1ramk\u00f6ri mint\u00e1k maszkokr\u00f3l a lapk\u00e1kra t\u00f6rt\u00e9n\u0151 \u00e1tvitel\u00e9nek egyik alapvet\u0151 folyamata. A mar\u00f3 berendez\u00e9sek elt\u00e1vol\u00edtj\u00e1k az anyagot a szelet fel\u00fclet\u00e9r\u0151l, hogy az integr\u00e1lt \u00e1ramk\u00f6r\u00f6kh\u00f6z sz\u00fcks\u00e9ges pontos mikrostrukt\u00far\u00e1kat alak\u00edtsanak ki. A marat\u00e1si folyamatok sz\u00e1raz marat\u00e1sra \u00e9s nedves marat\u00e1sra oszthat\u00f3k.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Sz\u00e1raz marat\u00e1s<\/strong>, amely az alkalmaz\u00e1sok t\u00f6bb mint 90%-j\u00e9t uralja, mag\u00e1ban foglalja a plazma marat\u00e1st, az ionporlaszt\u00e1st \u00e9s a reakt\u00edv ionmarat\u00e1st. Jobb anizotr\u00f3pi\u00e1t \u00e9s pontoss\u00e1got k\u00edn\u00e1l a szubmikronos jellemz\u0151k eset\u00e9ben.<\/li>\n\n\n\n<li><strong>Nedves marat\u00e1s<\/strong> jellemz\u0151en a nagyobb von\u00e1sok vagy a sz\u00e1raz marad\u00e9kok elt\u00e1vol\u00edt\u00e1sa ut\u00e1n haszn\u00e1lj\u00e1k.<\/li>\n<\/ul>\n\n\n\n<p>A sz\u00e1raz marat\u00e1s fizikai marat\u00e1sra \u00e9s k\u00e9miai marat\u00e1sra is kategoriz\u00e1lhat\u00f3. A fizikai marat\u00e1s ionbomb\u00e1z\u00e1sra t\u00e1maszkodik, m\u00edg a k\u00e9miai marat\u00e1s olyan reakt\u00edv plazm\u00e1kat alkalmaz, amelyek ill\u00e9kony mell\u00e9kterm\u00e9keket k\u00e9peznek. Ezek a technik\u00e1k kritikus fontoss\u00e1g\u00faak a logikai \u00e9s mem\u00f3riachipek gy\u00e1rt\u00e1sa sor\u00e1n.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">3. V\u00e9konyr\u00e9teg lev\u00e1laszt\u00f3 berendez\u00e9sek<\/h3>\n\n\n\n<p>A v\u00e9konyr\u00e9teg-lev\u00e1laszt\u00f3 berendez\u00e9sek n\u00e9lk\u00fcl\u00f6zhetetlenek a vezet\u0151 vagy szigetel\u0151 r\u00e9tegek l\u00e9trehoz\u00e1s\u00e1hoz az osty\u00e1kon. A f\u0151bb lev\u00e1laszt\u00e1si technik\u00e1k a k\u00f6vetkez\u0151k:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>K\u00e9miai g\u0151zf\u00e1zis\u00fa lev\u00e1laszt\u00e1s (CVD)<\/strong> - A PECVD, LPCVD, APCVD \u00e9s SACVD v\u00e1ltozatok lehet\u0151v\u00e9 teszik a szil\u00edcium-dioxid, szil\u00edcium-nitrid \u00e9s m\u00e1s anyagok nagy egyenletess\u00e9g\u0171 \u00e9s alacsony hibaar\u00e1ny\u00fa lev\u00e1laszt\u00e1s\u00e1t.<\/li>\n\n\n\n<li><strong>Fizikai g\u0151zf\u00e1zis\u00fa lev\u00e1laszt\u00e1s (PVD)<\/strong> - F\u0151leg porlaszt\u00e1s, amelyet a CMOS-eszk\u00f6z\u00f6k f\u00e9mr\u00e9tegeihez haszn\u00e1lnak.<\/li>\n\n\n\n<li><strong>Atomr\u00e9teg lev\u00e1laszt\u00e1s (ALD)<\/strong> - Lehet\u0151v\u00e9 teszi az ultra-v\u00e9kony, nagy pontoss\u00e1g\u00fa r\u00e9tegeket, amelyek kritikusak a fejlett csom\u00f3pontok \u00e9s a 3D NAND strukt\u00far\u00e1k sz\u00e1m\u00e1ra.<\/li>\n<\/ul>\n\n\n\n<p>A 3D-s mem\u00f3riaeszk\u00f6z\u00f6k \u00e9s a FinFET-strukt\u00far\u00e1k egyre \u00f6sszetettebb\u00e9 v\u00e1l\u00e1s\u00e1val a v\u00e9konyr\u00e9teg-lev\u00e1laszt\u00f3 berendez\u00e9sek ir\u00e1nti kereslet tov\u00e1bb n\u0151, mind hazai, mind nemzetk\u00f6zi szinten.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">4. M\u00e9r\u00e9stechnikai \u00e9s ellen\u0151rz\u0151 berendez\u00e9sek<\/h3>\n\n\n\n<p>A metrol\u00f3giai \u00e9s ellen\u0151rz\u00e9si eszk\u00f6z\u00f6k kulcsfontoss\u00e1g\u00faak a magas hozam fenntart\u00e1s\u00e1hoz \u00e9s a gy\u00e1rt\u00e1si k\u00f6lts\u00e9gek cs\u00f6kkent\u00e9s\u00e9hez.<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>M\u00e9r\u00e9stechnikai berendez\u00e9sek<\/strong> a folyamatok megfelel\u0151s\u00e9g\u00e9nek biztos\u00edt\u00e1sa \u00e9rdek\u00e9ben m\u00e9ri az ostyaszerkezeteket, a v\u00e9konyr\u00e9teg vastags\u00e1g\u00e1t, a kritikus m\u00e9reteket \u00e9s a fel\u00fcleti morfol\u00f3gi\u00e1t.<\/li>\n\n\n\n<li><strong>Ellen\u0151rz\u0151 berendez\u00e9sek<\/strong> felismeri az olyan hib\u00e1kat, mint a r\u00e9szecsk\u00e9k, karcol\u00e1sok vagy \u00e1ramk\u00f6ri anom\u00e1li\u00e1k a hozamvesztes\u00e9g megel\u0151z\u00e9se \u00e9rdek\u00e9ben.<\/li>\n<\/ul>\n\n\n\n<p>A k\u00ednai piac az elm\u00falt \u00e9vekben jelent\u0151sen n\u0151tt, \u00e9s egyre nagyobb r\u00e9szesed\u00e9ssel rendelkezik a f\u00e9lvezet\u0151-ellen\u0151rz\u0151 berendez\u00e9sek glob\u00e1lis piac\u00e1n.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">5. Ionbe\u00fcltet\u0151 berendez\u00e9s<\/h3>\n\n\n\n<p>Az ionimplant\u00e1ci\u00f3 a f\u00e9lvezet\u0151 osty\u00e1k adal\u00e9kol\u00e1s\u00e1nak kulcsfontoss\u00e1g\u00fa folyamata. Ennek sor\u00e1n meghat\u00e1rozott elemek ionjait gyors\u00edtj\u00e1k be a lapk\u00e1ba az elektromos tulajdons\u00e1gok pontos megv\u00e1ltoztat\u00e1sa \u00e9rdek\u00e9ben. A hagyom\u00e1nyos termikus diff\u00fazi\u00f3s adal\u00e9kol\u00e1ssal szembeni el\u0151nyei a k\u00f6vetkez\u0151k:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li>Az adal\u00e9kanyag-eloszl\u00e1s nagyfok\u00fa egyenletess\u00e9ge \u00e9s szab\u00e1lyozhat\u00f3s\u00e1ga<\/li>\n\n\n\n<li>Szelekt\u00edv mint\u00e1s ter\u00fcletek szelekt\u00edv fest\u00e9s\u00e9nek k\u00e9pess\u00e9ge<\/li>\n\n\n\n<li>Az anyag oldhat\u00f3s\u00e1ga nem jelent korl\u00e1toz\u00e1st<\/li>\n<\/ul>\n\n\n\n<p>Az ionimplant\u00e1ci\u00f3t sz\u00e9les k\u00f6rben alkalmazz\u00e1k a fejlett logikai, mem\u00f3ria- \u00e9s napelemgy\u00e1rt\u00e1sban. A hazai fejleszt\u00e9s jelent\u0151s m\u00e9rf\u00f6ldk\u00f6veket \u00e9rt el, \u00e9s a fejlett csom\u00f3pontok 12 h\u00fcvelykes osty\u00e1inak teljes folyamat\u00e1t t\u00e1mogatja.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">6. Tiszt\u00edt\u00f3 berendez\u00e9sek<\/h3>\n\n\n\n<p>Az ostyatiszt\u00edt\u00e1s a r\u00e9szecsk\u00e9k, maradv\u00e1nyok, f\u00e9mek \u00e9s egy\u00e9b szennyez\u0151d\u00e9sek elt\u00e1vol\u00edt\u00e1s\u00e1val biztos\u00edtja a nagy hozamot \u00e9s az eszk\u00f6z teljes\u00edtm\u00e9ny\u00e9t. A tiszt\u00edt\u00f3berendez\u00e9sek k\u00e9t f\u0151 megk\u00f6zel\u00edt\u00e9st alkalmaznak:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Nedves tiszt\u00edt\u00e1s<\/strong> - Vegyi oldatokat \u00e9s ioncser\u00e9lt vizet haszn\u00e1l, gyakran ultrahangos vagy permetez\u00e9ssel seg\u00edtett elj\u00e1r\u00e1sokkal; a tiszt\u00edt\u00e1si l\u00e9p\u00e9sek t\u00f6bb mint 90%-j\u00e9t teszi ki.<\/li>\n\n\n\n<li><strong>Vegytiszt\u00edt\u00e1s<\/strong> - G\u00e1zf\u00e1zis\u00fa vegyi anyagokat vagy plazm\u00e1t haszn\u00e1l bizonyos szennyez\u0151d\u00e9sek elt\u00e1vol\u00edt\u00e1s\u00e1ra, f\u0151k\u00e9nt fejlett csom\u00f3pontokban alkalmazz\u00e1k.<\/li>\n<\/ul>\n\n\n\n<p>A tiszt\u00edt\u00e1si technol\u00f3gi\u00e1k folyamatosan fejl\u0151dnek a kisebb l\u00e1bnyom, a nagyobb hat\u00e9konys\u00e1g \u00e9s a k\u00f6rnyezetbar\u00e1t m\u0171k\u00f6d\u00e9s ir\u00e1ny\u00e1ba. A 3D integr\u00e1lt \u00e1ramk\u00f6r\u00f6k n\u00f6vekv\u0151 \u00f6sszetetts\u00e9ge a teljes ostyagy\u00e1rt\u00e1s sor\u00e1n ig\u00e9nyt t\u00e1maszt a kifinomult tiszt\u00edt\u00e1si elj\u00e1r\u00e1sokra.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">7. K\u00e9miai mechanikai pol\u00edroz\u00f3 (CMP) berendez\u00e9sek<\/h3>\n\n\n\n<p>A CMP-berendez\u00e9sek a k\u00e9miai marat\u00e1s \u00e9s a mechanikai pol\u00edroz\u00e1s kombin\u00e1l\u00e1s\u00e1val v\u00e9gzik a lapk\u00e1k fel\u00fclet\u00e9nek \u00e1tfog\u00f3 s\u00edkos\u00edt\u00e1s\u00e1t. Ez biztos\u00edtja a lapka s\u00edkoss\u00e1g\u00e1t a k\u00e9s\u0151bbi marat\u00e1si vagy lev\u00e1laszt\u00e1si folyamatokhoz, \u00e9s kritikus fontoss\u00e1g\u00fa a fejlett csomagol\u00e1si alkalmaz\u00e1sokban, p\u00e9ld\u00e1ul a 2,5D\/3D IC-integr\u00e1ci\u00f3ban \u00e9s a TSV-szerkezetekben.<\/p>\n\n\n\n<p>Az eszk\u00f6z\u00f6k \u00f6sszetetts\u00e9g\u00e9nek \u00e9s a f\u00e9mr\u00e9tegek egym\u00e1sra r\u00e9tegz\u0151d\u00e9s\u00e9nek n\u00f6veked\u00e9s\u00e9vel a CMP alapvet\u0151 fontoss\u00e1g\u00fav\u00e1 v\u00e1lik az egyenletess\u00e9g fenntart\u00e1s\u00e1hoz, a hib\u00e1k minimaliz\u00e1l\u00e1s\u00e1hoz \u00e9s a nagy felbont\u00e1s\u00fa litogr\u00e1fia lehet\u0151v\u00e9 t\u00e9tel\u00e9hez.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">8. F\u00e9lvezet\u0151 tesztberendez\u00e9sek<\/h3>\n\n\n\n<p>A tesztel\u00e9s biztos\u00edtja, hogy a f\u00e9lvezet\u0151 eszk\u00f6z\u00f6k megfeleljenek a funkcion\u00e1lis \u00e9s elektromos specifik\u00e1ci\u00f3knak. A tesztberendez\u00e9sek k\u00f6z\u00e9 tartoznak:<\/p>\n\n\n\n<ul class=\"wp-block-list\">\n<li><strong>Tesztel\u0151k<\/strong> - \u00c9rt\u00e9kelje az osty\u00e1k \u00e9s a csomagolt chipek teljes\u00edtm\u00e9ny\u00e9t \u00e9s funkcionalit\u00e1s\u00e1t.<\/li>\n\n\n\n<li><strong>Szond\u00e1z\u00f3 \u00e1llom\u00e1sok<\/strong> - Csatlakoztassa az osty\u00e1kat a tesztel\u0151kh\u00f6z az in-line tesztel\u00e9shez.<\/li>\n\n\n\n<li><strong>Sorterek<\/strong> - Automatiz\u00e1lja a vizsg\u00e1lt eszk\u00f6z\u00f6k kezel\u00e9s\u00e9t \u00e9s oszt\u00e1lyoz\u00e1s\u00e1t.<\/li>\n<\/ul>\n\n\n\n<p>A tesztel\u00e9s a berendez\u00e9sek \u00e9rt\u00e9k\u00e9nek jelent\u0151s r\u00e9sz\u00e9t teszi ki, gyakran meghaladja a 60%-t, ami kiemeli fontoss\u00e1g\u00e1t a f\u00e9lvezet\u0151 \u00e9rt\u00e9kl\u00e1ncban a szeletgy\u00e1rt\u00e1st\u00f3l a v\u00e9gs\u0151 \u00f6sszeszerel\u00e9sig.<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">K\u00f6vetkeztet\u00e9s<\/h3>\n\n\n\n<p>A f\u00e9lvezet\u0151berendez\u00e9sek ipara a litogr\u00e1fia, marat\u00e1s, lev\u00e1laszt\u00e1s, m\u00e9r\u00e9stechnika, ionimplant\u00e1ci\u00f3, tiszt\u00edt\u00e1s, CMP \u00e9s tesztel\u00e9s szegmenseit \u00f6leli fel. A technol\u00f3giai fejl\u0151d\u00e9s minden egyes kateg\u00f3ri\u00e1ban l\u00e9tfontoss\u00e1g\u00fa a nagyobb hozam, a kisebb folyamatcsom\u00f3pontok \u00e9s az \u00f6sszetettebb eszk\u00f6z\u00f6k el\u00e9r\u00e9s\u00e9hez. A hazai \u00e9s nemzetk\u00f6zi piacok n\u00f6veked\u00e9s\u00e9vel a folyamatos innov\u00e1ci\u00f3, automatiz\u00e1l\u00e1s \u00e9s precizit\u00e1s tov\u00e1bbra is kulcsfontoss\u00e1g\u00fa t\u00e9nyez\u0151 marad a f\u00e9lvezet\u0151 berendez\u00e9sek \u00e1gazat\u00e1ban.<\/p>","protected":false},"excerpt":{"rendered":"<p>The semiconductor manufacturing industry relies on a wide array of highly specialized equipment to produce advanced integrated circuits. This article provides an overview of eight critical categories of semiconductor equipment, examining their functions, technological significance, and industry trends. 1. Lithography Equipment Lithography machines are the cornerstone of semiconductor manufacturing. The lithography process defines the smallest [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":2073,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"footnotes":""},"categories":[24],"tags":[718,44,187,717,720,334,713,710,276,709,706,705,722,716,704,715,181,712,40,721,723,708,266,350,707,714,719,711],"class_list":["post-2072","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-industry-news","tag-3d-nand","tag-advanced-packaging","tag-ald","tag-ald-deposition","tag-chip-fabrication","tag-cmp","tag-cvd","tag-dry-etching","tag-etching-equipment","tag-ic-manufacturing","tag-ion-implantation","tag-metrology-equipment","tag-nanotechnology","tag-pecvd","tag-photolithography","tag-plasma-etching","tag-process-control","tag-pvd","tag-semiconductor-equipment","tag-semiconductor-industry","tag-semiconductor-process","tag-semiconductor-testing","tag-semiconductor-yield","tag-thin-film-deposition","tag-wafer-cleaning","tag-wafer-inspection","tag-wafer-planarization","tag-wet-etching"],"_links":{"self":[{"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/posts\/2072","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/comments?post=2072"}],"version-history":[{"count":1,"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/posts\/2072\/revisions"}],"predecessor-version":[{"id":2074,"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/posts\/2072\/revisions\/2074"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/media\/2073"}],"wp:attachment":[{"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/media?parent=2072"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/categories?post=2072"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.zmsh-semitech.com\/hu\/wp-json\/wp\/v2\/tags?post=2072"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}