{"id":2021,"date":"2026-03-27T01:46:43","date_gmt":"2026-03-27T01:46:43","guid":{"rendered":"https:\/\/www.zmsh-semitech.com\/?post_type=product&#038;p=2021"},"modified":"2026-03-27T01:46:45","modified_gmt":"2026-03-27T01:46:45","slug":"high-precision-wafer-bonding-equipment-for-si-si-sic-sic-heterogeneous-integration","status":"publish","type":"product","link":"https:\/\/www.zmsh-semitech.com\/fr\/product\/high-precision-wafer-bonding-equipment-for-si-si-sic-sic-heterogeneous-integration\/","title":{"rendered":"High-Precision Wafer Bonding Equipment for Si-Si, SiC-SiC &#038; Heterogeneous Integration"},"content":{"rendered":"<p data-start=\"288\" data-end=\"699\">The Wafer Bonding Equipment is a high-performance system engineered for advanced semiconductor packaging, MEMS fabrication, and third-generation semiconductor integration. It supports 2-inch to 12-inch wafers and enables room-temperature direct bonding and hydrophilic bonding, making it particularly suitable for Si-Si, SiC-SiC, and heterogeneous material bonding (Si-SiC, GaN, Sapphire, etc.).<\/p>\n<p data-start=\"288\" data-end=\"699\"><img fetchpriority=\"high\" decoding=\"async\" class=\"wp-image-2025 size-full aligncenter\" src=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration33.png\" alt=\"\" width=\"680\" height=\"310\" srcset=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration33.png 680w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration33-300x137.png 300w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration33-18x8.png 18w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration33-600x274.png 600w\" sizes=\"(max-width: 680px) 100vw, 680px\" \/><\/p>\n<p data-start=\"701\" data-end=\"1001\">Designed for both R&amp;D environments and mass production, the system integrates ultra-precision alignment, closed-loop pressure and temperature control, and ultra-high vacuum bonding conditions, ensuring high bonding strength, excellent interface uniformity, and low defect density.<\/p>\n<h1 data-section-id=\"5wwv7v\" data-start=\"1008\" data-end=\"1032\"><span role=\"text\">Caract\u00e9ristiques principales<\/span><\/h1>\n<h3 data-section-id=\"1moc4qg\" data-start=\"1034\" data-end=\"1089\"><span role=\"text\"><img decoding=\"async\" class=\"size-medium wp-image-2027 alignright\" src=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration11-300x205.png\" alt=\"\" width=\"300\" height=\"205\" srcset=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration11-300x205.png 300w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration11-18x12.png 18w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration11-600x409.png 600w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration11.png 680w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/>1. Advanced Room-Temperature Bonding Technology<\/span><\/h3>\n<ul data-start=\"1090\" data-end=\"1275\">\n<li data-section-id=\"1mm29lt\" data-start=\"1090\" data-end=\"1137\">Eliminates thermal stress and wafer warpage<\/li>\n<li data-section-id=\"ln8v6d\" data-start=\"1138\" data-end=\"1211\">Enables bonding of temperature-sensitive and dissimilar materials<\/li>\n<li data-section-id=\"1bb2rki\" data-start=\"1212\" data-end=\"1275\">Supports hydrophilic bonding and plasma-activated bonding<\/li>\n<\/ul>\n<h3 data-section-id=\"mvg0ku\" data-start=\"1277\" data-end=\"1318\"><span role=\"text\">2. Ultra-High Precision Alignment<\/span><\/h3>\n<ul data-start=\"1319\" data-end=\"1452\">\n<li data-section-id=\"nib7cj\" data-start=\"1319\" data-end=\"1359\">Mark alignment accuracy: \u2264 \u00b12 \u03bcm<\/li>\n<li data-section-id=\"3dmnqq\" data-start=\"1360\" data-end=\"1401\">Edge alignment accuracy: \u2264 \u00b150 \u03bcm<\/li>\n<li data-section-id=\"skx64n\" data-start=\"1402\" data-end=\"1452\">Optional upgrade to submicron alignment system<\/li>\n<\/ul>\n<h3 data-section-id=\"zhuyd5\" data-start=\"1454\" data-end=\"1506\"><span role=\"text\">3. High Bonding Strength &amp; Interface Quality<\/span><\/h3>\n<ul data-start=\"1507\" data-end=\"1678\">\n<li data-section-id=\"1g876j\" data-start=\"1507\" data-end=\"1568\">\u2265 2.0 J\/m\u00b2 (Si-Si direct bonding at room temperature)<\/li>\n<li data-section-id=\"11zitz1\" data-start=\"1569\" data-end=\"1621\">Up to \u22655 J\/m\u00b2 with plasma surface activation<\/li>\n<li data-section-id=\"4r7u1t\" data-start=\"1622\" data-end=\"1678\">Excellent interface cleanliness under UHV conditions<\/li>\n<\/ul>\n<h3 data-section-id=\"1p6le9y\" data-start=\"1680\" data-end=\"1718\"><span role=\"text\">4. Wide Material Compatibility<\/span><\/h3>\n<p data-start=\"1719\" data-end=\"1739\">Supports bonding of:<\/p>\n<ul data-start=\"1740\" data-end=\"1864\">\n<li data-section-id=\"aojy5e\" data-start=\"1740\" data-end=\"1783\">Semiconductors: Si, SiC, GaN, GaAs, InP<\/li>\n<li data-section-id=\"f2gy5g\" data-start=\"1784\" data-end=\"1822\">Optical materials: Sapphire, Glass<\/li>\n<li data-section-id=\"v9y58o\" data-start=\"1823\" data-end=\"1864\">Functional materials: LiNbO\u2083, Diamond<\/li>\n<\/ul>\n<h3 data-section-id=\"zfgn77\" data-start=\"1866\" data-end=\"1904\"><span role=\"text\">5. Flexible Process Capability<\/span><\/h3>\n<ul data-start=\"1905\" data-end=\"2043\">\n<li data-section-id=\"1y6punm\" data-start=\"1905\" data-end=\"1933\">Wafer size: 2&#8243; \u2013 12&#8243;<\/li>\n<li data-section-id=\"qz7nz2\" data-start=\"1934\" data-end=\"1982\">Compatible with irregular-shaped samples<\/li>\n<li data-section-id=\"v2ier\" data-start=\"1983\" data-end=\"2043\">Optional modules: pre-heating \/ annealing (RT\u2013500\u00b0C)<\/li>\n<\/ul>\n<h1 data-section-id=\"m12c1z\" data-start=\"2050\" data-end=\"2086\"><span role=\"text\">Sp\u00e9cifications techniques<\/span><\/h1>\n<div class=\"TyagGW_tableContainer\">\n<div class=\"group TyagGW_tableWrapper flex flex-col-reverse w-fit\" tabindex=\"-1\">\n<table class=\"w-fit min-w-(--thread-content-width)\" data-start=\"2088\" data-end=\"2479\">\n<thead data-start=\"2088\" data-end=\"2117\">\n<tr data-start=\"2088\" data-end=\"2117\">\n<th class=\"\" data-start=\"2088\" data-end=\"2100\" data-col-size=\"sm\">Param\u00e8tres<\/th>\n<th class=\"\" data-start=\"2100\" data-end=\"2117\" data-col-size=\"md\">Sp\u00e9cifications<\/th>\n<\/tr>\n<\/thead>\n<tbody data-start=\"2145\" data-end=\"2479\">\n<tr data-start=\"2145\" data-end=\"2208\">\n<td data-start=\"2145\" data-end=\"2163\" data-col-size=\"sm\">Bonding Methods<\/td>\n<td data-col-size=\"md\" data-start=\"2163\" data-end=\"2208\">Direct Bonding \/ Plasma-Activated Bonding<\/td>\n<\/tr>\n<tr data-start=\"2209\" data-end=\"2234\">\n<td data-start=\"2209\" data-end=\"2222\" data-col-size=\"sm\">Taille de la plaquette<\/td>\n<td data-col-size=\"md\" data-start=\"2222\" data-end=\"2234\">2&#8243; \u2013 12&#8243;<\/td>\n<\/tr>\n<tr data-start=\"2235\" data-end=\"2266\">\n<td data-start=\"2235\" data-end=\"2252\" data-col-size=\"sm\">Gamme de pression<\/td>\n<td data-col-size=\"md\" data-start=\"2252\" data-end=\"2266\">0 \u2013 10 MPa<\/td>\n<\/tr>\n<tr data-start=\"2267\" data-end=\"2289\">\n<td data-start=\"2267\" data-end=\"2279\" data-col-size=\"sm\">Max Force<\/td>\n<td data-col-size=\"md\" data-start=\"2279\" data-end=\"2289\">100 kN<\/td>\n<\/tr>\n<tr data-start=\"2290\" data-end=\"2342\">\n<td data-start=\"2290\" data-end=\"2310\" data-col-size=\"sm\">Plage de temp\u00e9rature<\/td>\n<td data-col-size=\"md\" data-start=\"2310\" data-end=\"2342\">Room Temp \u2013 500\u00b0C (Optional)<\/td>\n<\/tr>\n<tr data-start=\"2343\" data-end=\"2377\">\n<td data-start=\"2343\" data-end=\"2358\" data-col-size=\"sm\">Niveau de vide<\/td>\n<td data-col-size=\"md\" data-start=\"2358\" data-end=\"2377\">\u2264 5 \u00d7 10\u207b\u2076 Torr<\/td>\n<\/tr>\n<tr data-start=\"2378\" data-end=\"2434\">\n<td data-start=\"2378\" data-end=\"2399\" data-col-size=\"sm\">Alignment Accuracy<\/td>\n<td data-col-size=\"md\" data-start=\"2399\" data-end=\"2434\">\u2264 \u00b12 \u03bcm (Mark), \u2264 \u00b150 \u03bcm (Edge)<\/td>\n<\/tr>\n<tr data-start=\"2435\" data-end=\"2479\">\n<td data-start=\"2435\" data-end=\"2454\" data-col-size=\"sm\">Bonding Strength<\/td>\n<td data-col-size=\"md\" data-start=\"2454\" data-end=\"2479\">\u2265 2.0 J\/m\u00b2 (RT Si-Si)<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n<\/div>\n<h1 data-section-id=\"zfv5ao\" data-start=\"2486\" data-end=\"2526\"><span role=\"text\"><img decoding=\"async\" class=\"size-medium wp-image-2026 alignright\" src=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration22-300x300.jpg\" alt=\"\" width=\"300\" height=\"300\" srcset=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration22-300x300.jpg 300w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration22-150x150.jpg 150w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration22-12x12.jpg 12w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration22-600x600.jpg 600w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration22-100x100.jpg 100w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/03\/High-Precision-Wafer-Bonding-Equipment-for-Si-Si-SiC-SiC-Heterogeneous-Integration22.jpg 680w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/>Syst\u00e8me de contr\u00f4le intelligent<\/span><\/h1>\n<ul data-start=\"2528\" data-end=\"2714\">\n<li data-section-id=\"14izt1u\" data-start=\"2528\" data-end=\"2564\">Industrial-grade touchscreen HMI<\/li>\n<li data-section-id=\"1uxdjyr\" data-start=\"2565\" data-end=\"2609\">Supports 50+ process recipes storage<\/li>\n<li data-section-id=\"1rxz05m\" data-start=\"2610\" data-end=\"2668\">Real-time pressure-temperature closed-loop control<\/li>\n<li data-section-id=\"1ozy6m8\" data-start=\"2669\" data-end=\"2714\">Stable and repeatable process performance<\/li>\n<\/ul>\n<h1 data-section-id=\"18ww9ca\" data-start=\"2721\" data-end=\"2755\"><span role=\"text\">Safety &amp; Reliability<\/span><\/h1>\n<ul data-start=\"2757\" data-end=\"2903\">\n<li data-section-id=\"10d2f0j\" data-start=\"2757\" data-end=\"2822\">Triple interlock protection (pressure \/ temperature \/ vacuum)<\/li>\n<li data-section-id=\"dhf3uk\" data-start=\"2823\" data-end=\"2848\">Emergency stop system<\/li>\n<li data-section-id=\"whub1n\" data-start=\"2849\" data-end=\"2903\">Designed for Class 100 cleanroom compatibility<\/li>\n<\/ul>\n<h1 data-section-id=\"mn9rfz\" data-start=\"2910\" data-end=\"2945\"><span role=\"text\">Configurations optionnelles<\/span><\/h1>\n<ul data-start=\"2947\" data-end=\"3105\">\n<li data-section-id=\"12zom6j\" data-start=\"2947\" data-end=\"2980\">Robotic wafer handling system<\/li>\n<li data-section-id=\"1cj0mfu\" data-start=\"2981\" data-end=\"3041\">SECS\/GEM communication interface (fab integration ready)<\/li>\n<li data-section-id=\"p5iwlh\" data-start=\"3042\" data-end=\"3070\">Inline inspection module<\/li>\n<li data-section-id=\"16mmjf1\" data-start=\"3071\" data-end=\"3105\">Plasma surface activation unit<\/li>\n<\/ul>\n<h1 data-section-id=\"18cso9d\" data-start=\"3112\" data-end=\"3144\"><span role=\"text\">Applications typiques<\/span><\/h1>\n<h3 data-section-id=\"jeqpgw\" data-start=\"3146\" data-end=\"3171\"><span role=\"text\">1. MEMS Packaging<\/span><\/h3>\n<p data-start=\"3172\" data-end=\"3240\">Hermetic sealing for sensors such as accelerometers and gyroscopes<\/p>\n<h3 data-section-id=\"1hvce9l\" data-start=\"3242\" data-end=\"3270\"><span role=\"text\">2. 3D IC Integration<\/span><\/h3>\n<p data-start=\"3271\" data-end=\"3318\">Wafer stacking for TSV and advanced packaging<\/p>\n<h3 data-section-id=\"r6vanu\" data-start=\"3320\" data-end=\"3361\"><span role=\"text\">3. Compound Semiconductor Devices<\/span><\/h3>\n<p data-start=\"3362\" data-end=\"3413\">GaN \/ SiC power device bonding and layer transfer<\/p>\n<h3 data-section-id=\"ssea6s\" data-start=\"3415\" data-end=\"3450\"><span role=\"text\">4. CMOS Image Sensors (CIS)<\/span><\/h3>\n<p data-start=\"3451\" data-end=\"3514\">Low-temperature bonding of CMOS wafers and optical substrates<\/p>\n<h3 data-section-id=\"1y9q4j3\" data-start=\"3516\" data-end=\"3551\"><span role=\"text\">5. Biochips &amp; Microfluidics<\/span><\/h3>\n<p data-start=\"3552\" data-end=\"3594\">Reliable bonding for lab-on-chip devices<\/p>\n<h1 data-section-id=\"3cguag\" data-start=\"3601\" data-end=\"3628\"><span role=\"text\">Process Example<\/span><\/h1>\n<p data-start=\"3630\" data-end=\"3681\">LiNbO\u2083 \u2013 SiC Wafer Bonding (Room Temperature)<\/p>\n<ul data-start=\"3682\" data-end=\"3843\">\n<li data-section-id=\"1o8nths\" data-start=\"3682\" data-end=\"3731\">Achieves strong and uniform bonding interface<\/li>\n<li data-section-id=\"1xut4n0\" data-start=\"3732\" data-end=\"3779\">Verified by cross-sectional TEM imaging<\/li>\n<li data-section-id=\"8apvvl\" data-start=\"3780\" data-end=\"3843\">Suitable for high-frequency and optoelectronic applications<\/li>\n<\/ul>\n<h1 data-section-id=\"ou04n2\" data-start=\"3850\" data-end=\"3865\"><span role=\"text\">Q&amp;A<\/span><\/h1>\n<h3 data-section-id=\"1fr6ndv\" data-start=\"3867\" data-end=\"3950\"><span role=\"text\">Q1: Why choose room-temperature wafer bonding instead of thermal bonding?<\/span><\/h3>\n<p data-start=\"3951\" data-end=\"4102\">Room-temperature bonding avoids thermal mismatch and stress, making it ideal for heterogeneous materials and improving yield in advanced packaging.<\/p>\n<h3 data-section-id=\"xty3bz\" data-start=\"4104\" data-end=\"4147\"><span role=\"text\">Q2: What materials can be bonded?<\/span><\/h3>\n<p data-start=\"4148\" data-end=\"4206\">The system supports a wide range of materials including:<\/p>\n<ul data-start=\"4207\" data-end=\"4283\">\n<li data-section-id=\"xp1h29\" data-start=\"4207\" data-end=\"4239\">Semiconductors: Si, SiC, GaN<\/li>\n<li data-section-id=\"19cjnz4\" data-start=\"4240\" data-end=\"4264\">Oxides: SiO\u2082, LiNbO\u2083<\/li>\n<li data-section-id=\"1el5xj2\" data-start=\"4265\" data-end=\"4283\">Metals: Cu, Au<\/li>\n<\/ul>\n<h1 data-section-id=\"ge900y\" data-start=\"4290\" data-end=\"4330\"><span role=\"text\">Why Choose This System<\/span><\/h1>\n<ul data-start=\"4332\" data-end=\"4607\">\n<li data-section-id=\"kavyah\" data-start=\"4332\" data-end=\"4392\">Proven performance in SiC power device manufacturing<\/li>\n<li data-section-id=\"1sbvzor\" data-start=\"4393\" data-end=\"4463\">Verified bonding strength through lab testing and TEM analysis<\/li>\n<li data-section-id=\"1qqgx94\" data-start=\"4464\" data-end=\"4529\">Designed for both research institutes and industrial fabs<\/li>\n<li data-section-id=\"13zv0if\" data-start=\"4530\" data-end=\"4607\">Modular architecture ensures long-term scalability and upgradeability<\/li>\n<\/ul>","protected":false},"excerpt":{"rendered":"<p>The Wafer Bonding Equipment is a high-performance system engineered for advanced semiconductor packaging, MEMS fabrication, and third-generation semiconductor integration.<\/p>","protected":false},"featured_media":2024,"comment_status":"open","ping_status":"closed","template":"","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"default","adv-header-id-meta":"","stick-header-meta":"default","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center 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