{"id":2316,"date":"2026-04-21T06:05:44","date_gmt":"2026-04-21T06:05:44","guid":{"rendered":"https:\/\/www.zmsh-semitech.com\/?post_type=product&#038;p=2316"},"modified":"2026-04-21T06:05:45","modified_gmt":"2026-04-21T06:05:45","slug":"ion-beam-etching-machine-for-si-sio2-and-metal-materials-in-semiconductor-fabrication","status":"publish","type":"product","link":"https:\/\/www.zmsh-semitech.com\/es\/product\/ion-beam-etching-machine-for-si-sio2-and-metal-materials-in-semiconductor-fabrication\/","title":{"rendered":"M\u00e1quina de grabado i\u00f3nico para SiO2 y materiales met\u00e1licos en la fabricaci\u00f3n de semiconductores"},"content":{"rendered":"<p data-start=\"297\" data-end=\"643\"><img fetchpriority=\"high\" decoding=\"async\" class=\"size-medium wp-image-2320 alignright\" src=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication-300x300.webp\" alt=\"\" width=\"300\" height=\"300\" srcset=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication-300x300.webp 300w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication-150x150.webp 150w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication-12x12.webp 12w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication-600x600.webp 600w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication-100x100.webp 100w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication.webp 750w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/>La m\u00e1quina de grabado por haz de iones para Si, SiO2 y materiales met\u00e1licos es un sistema de grabado en seco de alta precisi\u00f3n dise\u00f1ado para aplicaciones avanzadas de microfabricaci\u00f3n y nanotecnolog\u00eda. Utilizando el grabado por haz de iones (IBE), tambi\u00e9n conocido como fresado i\u00f3nico, este equipo permite eliminar gran cantidad de material mediante un proceso de pulverizaci\u00f3n cat\u00f3dica puramente f\u00edsico.<\/p>\n<p data-start=\"645\" data-end=\"961\">A diferencia de las tecnolog\u00edas convencionales de grabado por plasma, el grabado por haz de iones no expone el sustrato directamente al plasma. Esto reduce significativamente los riesgos de da\u00f1os inducidos por el plasma, la contaminaci\u00f3n y la acumulaci\u00f3n de carga, por lo que es especialmente adecuado para la fabricaci\u00f3n de semiconductores sensibles y dispositivos \u00f3pticos.<\/p>\n<p data-start=\"963\" data-end=\"1148\">Con una precisi\u00f3n nanom\u00e9trica y una excelente capacidad de control del proceso, este sistema se utiliza ampliamente en la fabricaci\u00f3n de semiconductores, el procesamiento de pel\u00edculas finas y la investigaci\u00f3n de materiales avanzados.<\/p>\n<hr data-start=\"1150\" data-end=\"1153\" \/>\n<h2 data-section-id=\"17sw59i\" data-start=\"1155\" data-end=\"1184\"><span role=\"text\"><img decoding=\"async\" class=\"wp-image-2324 alignright\" src=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication7-300x125.png\" alt=\"\" width=\"458\" height=\"191\" srcset=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication7-300x125.png 300w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication7-18x7.png 18w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication7-600x250.png 600w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication7.png 680w\" sizes=\"(max-width: 458px) 100vw, 458px\" \/>Principales caracter\u00edsticas t\u00e9cnicas<\/span><\/h2>\n<ul data-start=\"1186\" data-end=\"1929\">\n<li data-section-id=\"7yo1gz\" data-start=\"1186\" data-end=\"1324\">Precisi\u00f3n ultraelevada<br data-start=\"1212\" data-end=\"1215\" \/>Alcanza una resoluci\u00f3n de grabado de \u226410 nm, cumpliendo los requisitos avanzados de semiconductores y nanofabricaci\u00f3n.<\/li>\n<li data-section-id=\"csgjgf\" data-start=\"1326\" data-end=\"1497\">Capacidad de grabado no selectivo<br data-start=\"1364\" data-end=\"1367\" \/>Permite el grabado uniforme de m\u00faltiples materiales, incluidos metales, semiconductores y diel\u00e9ctricos, sin dependencia qu\u00edmica.<\/li>\n<li data-section-id=\"1xlwjqh\" data-start=\"1499\" data-end=\"1667\">Control anis\u00f3tropo y direccional<br data-start=\"1540\" data-end=\"1543\" \/>Los \u00e1ngulos ajustables del haz de iones permiten perfiles de grabado tanto anisotr\u00f3picos como isotr\u00f3picos, lo que facilita la transferencia de patrones complejos.<\/li>\n<li data-section-id=\"1ialgp0\" data-start=\"1669\" data-end=\"1793\">Entorno de procesamiento sin plasma<br data-start=\"1709\" data-end=\"1712\" \/>Elimina los da\u00f1os inducidos por el plasma, garantizando una mayor fiabilidad y rendimiento de los dispositivos.<\/li>\n<li data-section-id=\"1squn5z\" data-start=\"1795\" data-end=\"1929\">Excelente calidad de superficie<br data-start=\"1826\" data-end=\"1829\" \/>Produce superficies lisas con rugosidad reducida, cr\u00edticas para aplicaciones \u00f3pticas y electr\u00f3nicas.<\/li>\n<\/ul>\n<hr data-start=\"1931\" data-end=\"1934\" \/>\n<h2 data-section-id=\"crb813\" data-start=\"1936\" data-end=\"1965\"><span role=\"text\">Componentes b\u00e1sicos del sistema<\/span><\/h2>\n<p data-start=\"1967\" data-end=\"2042\">Un sistema completo de grabado por haz de iones consta de varios subsistemas cr\u00edticos:<\/p>\n<h3 data-section-id=\"j86wbp\" data-start=\"2044\" data-end=\"2068\"><span role=\"text\">1. Sistema de vac\u00edo<\/span><\/h3>\n<p data-start=\"2069\" data-end=\"2118\">Proporciona un entorno de alto vac\u00edo esencial para:<\/p>\n<ul data-start=\"2119\" data-end=\"2193\">\n<li data-section-id=\"1vzt3vq\" data-start=\"2119\" data-end=\"2137\">Estabilidad de la viga<\/li>\n<li data-section-id=\"svkbf3\" data-start=\"2138\" data-end=\"2163\">Control de la contaminaci\u00f3n<\/li>\n<li data-section-id=\"19d0yza\" data-start=\"2164\" data-end=\"2193\">Procesado de alta precisi\u00f3n<\/li>\n<\/ul>\n<h3 data-section-id=\"8jigvj\" data-start=\"2195\" data-end=\"2216\"><span role=\"text\">2. Fuente de iones<\/span><\/h3>\n<p data-start=\"2217\" data-end=\"2272\">Genera un haz de iones de alta energ\u00eda (normalmente iones de arg\u00f3n):<\/p>\n<ul data-start=\"2273\" data-end=\"2386\">\n<li data-section-id=\"116c4dh\" data-start=\"2273\" data-end=\"2315\">Determina la velocidad de grabado y la uniformidad<\/li>\n<li data-section-id=\"bdpzju\" data-start=\"2316\" data-end=\"2386\">Admite distintos tipos de fuentes, como fuentes de iones RF y Kaufman<\/li>\n<\/ul>\n<h3 data-section-id=\"1tpsqxl\" data-start=\"2388\" data-end=\"2411\"><span role=\"text\">3. Etapa de muestreo<\/span><\/h3>\n<ul data-start=\"2412\" data-end=\"2530\">\n<li data-section-id=\"d3z3he\" data-start=\"2412\" data-end=\"2468\">Admite rotaci\u00f3n multieje para un grabado uniforme<\/li>\n<li data-section-id=\"15yipgz\" data-start=\"2469\" data-end=\"2530\">El control integrado de la temperatura mejora la estabilidad del proceso<\/li>\n<\/ul>\n<h3 data-section-id=\"qoosxq\" data-start=\"2532\" data-end=\"2557\"><span role=\"text\">4. 4. Sistema de control<\/span><\/h3>\n<ul data-start=\"2558\" data-end=\"2705\">\n<li data-section-id=\"1mqnqw1\" data-start=\"2558\" data-end=\"2587\">Funcionamiento totalmente automatizado<\/li>\n<li data-section-id=\"ymbyxd\" data-start=\"2588\" data-end=\"2643\">Permite un control preciso de los par\u00e1metros y la repetibilidad<\/li>\n<li data-section-id=\"1kjf28e\" data-start=\"2644\" data-end=\"2705\">Detecci\u00f3n de punto final opcional para un control avanzado del proceso<\/li>\n<\/ul>\n<h3 data-section-id=\"97rafg\" data-start=\"2707\" data-end=\"2729\"><span role=\"text\">5. Neutralizador<\/span><\/h3>\n<ul data-start=\"2730\" data-end=\"2836\">\n<li data-section-id=\"12j0ebp\" data-start=\"2730\" data-end=\"2772\">Evita la acumulaci\u00f3n de carga durante el grabado<\/li>\n<li data-section-id=\"1o4nvb1\" data-start=\"2773\" data-end=\"2836\">Esencial para materiales aislantes como el SiO\u2082 y el Si\u2083N\u2084.<\/li>\n<\/ul>\n<hr data-start=\"2838\" data-end=\"2841\" \/>\n<h2 data-section-id=\"sgqumq\" data-start=\"2843\" data-end=\"2867\"><span role=\"text\">Principio de funcionamiento<\/span><\/h2>\n<p data-start=\"2869\" data-end=\"3006\"><img decoding=\"async\" class=\"size-medium wp-image-2321 alignright\" src=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-1-300x235.png\" alt=\"\" width=\"300\" height=\"235\" srcset=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-1-300x235.png 300w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-1-15x12.png 15w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-1-600x469.png 600w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-1.png 680w\" sizes=\"(max-width: 300px) 100vw, 300px\" \/>El grabado por haz de iones funciona dirigiendo un haz de iones colimado de alta energ\u00eda hacia la superficie del material objetivo en condiciones de vac\u00edo.<\/p>\n<p data-start=\"3008\" data-end=\"3253\">Los iones (normalmente Ar\u207a) chocan con los \u00e1tomos de la superficie, transfiriendo impulso y provocando la expulsi\u00f3n de \u00e1tomos mediante pulverizaci\u00f3n f\u00edsica. Este proceso elimina el material capa a capa, lo que permite definir patrones precisos sin reacciones qu\u00edmicas.<\/p>\n<p data-start=\"3255\" data-end=\"3296\">Esto hace que la OIE sea especialmente adecuada para:<\/p>\n<ul data-start=\"3297\" data-end=\"3403\">\n<li data-section-id=\"jy9ydi\" data-start=\"3297\" data-end=\"3333\">Transferencia de patrones de alta resoluci\u00f3n<\/li>\n<li data-section-id=\"1ihgsm0\" data-start=\"3334\" data-end=\"3376\">Materiales de baja reactividad qu\u00edmica<\/li>\n<li data-section-id=\"hl3mzt\" data-start=\"3377\" data-end=\"3403\">Estructuras multicapa<\/li>\n<\/ul>\n<hr data-start=\"3405\" data-end=\"3408\" \/>\n<h2 data-section-id=\"gimyd4\" data-start=\"3410\" data-end=\"3440\"><span role=\"text\">Capacidad de procesamiento<\/span><\/h2>\n<h3 data-section-id=\"ww5vbk\" data-start=\"3442\" data-end=\"3469\"><span role=\"text\">Materiales de apoyo<\/span><\/h3>\n<ul data-start=\"3470\" data-end=\"3622\">\n<li data-section-id=\"4dwycu\" data-start=\"3470\" data-end=\"3504\">Metales: Au, Pt, Cu, Ta, Al<\/li>\n<li data-section-id=\"12wc4i0\" data-start=\"3505\" data-end=\"3537\">Semiconductores: Si, GaAs<\/li>\n<li data-section-id=\"75kyg7\" data-start=\"3538\" data-end=\"3570\">Diel\u00e9ctricos: SiO\u2082, Si\u2083N\u2084<\/li>\n<li data-section-id=\"1xmdv1x\" data-start=\"3571\" data-end=\"3622\">Materiales avanzados: AlN, cer\u00e1mica, pol\u00edmeros<\/li>\n<\/ul>\n<hr data-start=\"3624\" data-end=\"3627\" \/>\n<h2 data-section-id=\"12vl3dy\" data-start=\"3629\" data-end=\"3656\"><span role=\"text\">Flujo t\u00edpico del proceso<\/span><\/h2>\n<ol data-start=\"3658\" data-end=\"4078\">\n<li data-section-id=\"1lq2akh\" data-start=\"3658\" data-end=\"3742\">Preparaci\u00f3n de la muestra<br data-start=\"3683\" data-end=\"3686\" \/>Limpiar y montar el sustrato en la c\u00e1mara de vac\u00edo<\/li>\n<li data-section-id=\"1uf7qj1\" data-start=\"3744\" data-end=\"3821\">Enmascaramiento<br data-start=\"3758\" data-end=\"3761\" \/>Aplicar m\u00e1scara fotorresistente o met\u00e1lica para definir las zonas de grabado<\/li>\n<li data-section-id=\"1sq3ygn\" data-start=\"3823\" data-end=\"3910\">Generaci\u00f3n de haces de iones<br data-start=\"3849\" data-end=\"3852\" \/>Activar la fuente de iones con gas inerte (normalmente arg\u00f3n)<\/li>\n<li data-section-id=\"46esbg\" data-start=\"3912\" data-end=\"4006\">Proceso de grabado<br data-start=\"3934\" data-end=\"3937\" \/>Ajuste la energ\u00eda del haz, el \u00e1ngulo y el tiempo para lograr la estructura deseada<\/li>\n<li data-section-id=\"oeifr6\" data-start=\"4008\" data-end=\"4078\">Eliminaci\u00f3n de la m\u00e1scara<br data-start=\"4027\" data-end=\"4030\" \/>Retire la m\u00e1scara para revelar los patrones grabados finales<\/li>\n<\/ol>\n<hr data-start=\"4080\" data-end=\"4083\" \/>\n<h2 data-section-id=\"1myoacb\" data-start=\"4085\" data-end=\"4109\"><span role=\"text\">\u00c1mbitos de aplicaci\u00f3n<\/span><\/h2>\n<h3 data-section-id=\"bm5nu5\" data-start=\"4111\" data-end=\"4146\"><span role=\"text\"><img loading=\"lazy\" decoding=\"async\" class=\"wp-image-2322 aligncenter\" src=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication6-300x65.png\" alt=\"\" width=\"724\" height=\"157\" srcset=\"https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication6-300x65.png 300w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication6-18x4.png 18w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication6-600x130.png 600w, https:\/\/www.zmsh-semitech.com\/wp-content\/uploads\/2026\/04\/Ion-Beam-Etching-Machine-for-Si-SiO2-and-Metal-Materials-in-Semiconductor-Fabrication6.png 680w\" sizes=\"(max-width: 724px) 100vw, 724px\" \/>Fabricaci\u00f3n de semiconductores<\/span><\/h3>\n<ul data-start=\"4147\" data-end=\"4236\">\n<li data-section-id=\"13vctk4\" data-start=\"4147\" data-end=\"4180\">Patrones de circuitos integrados<\/li>\n<li data-section-id=\"ofwy8d\" data-start=\"4181\" data-end=\"4206\">Estructuraci\u00f3n de pel\u00edculas finas<\/li>\n<li data-section-id=\"1x3kzva\" data-start=\"4207\" data-end=\"4236\">Fabricaci\u00f3n de nodos avanzados<\/li>\n<\/ul>\n<h3 data-section-id=\"1tse075\" data-start=\"4238\" data-end=\"4261\"><span role=\"text\">Dispositivos \u00f3pticos<\/span><\/h3>\n<ul data-start=\"4262\" data-end=\"4356\">\n<li data-section-id=\"v6a7ly\" data-start=\"4262\" data-end=\"4309\">Procesado de precisi\u00f3n de rejillas y lentes<\/li>\n<li data-section-id=\"lq2w9m\" data-start=\"4310\" data-end=\"4356\">Modificaci\u00f3n de la superficie de componentes \u00f3pticos<\/li>\n<\/ul>\n<h3 data-section-id=\"1wc0my6\" data-start=\"4358\" data-end=\"4380\"><span role=\"text\">Nanotecnolog\u00eda<\/span><\/h3>\n<ul data-start=\"4381\" data-end=\"4441\">\n<li data-section-id=\"178ey7v\" data-start=\"4381\" data-end=\"4441\">Fabricaci\u00f3n de nanocables, nanoporos y estructuras MEMS<\/li>\n<\/ul>\n<h3 data-section-id=\"krs816\" data-start=\"4443\" data-end=\"4468\"><span role=\"text\">Ciencia de los materiales<\/span><\/h3>\n<ul data-start=\"4469\" data-end=\"4541\">\n<li data-section-id=\"18ntl16\" data-start=\"4469\" data-end=\"4506\">An\u00e1lisis y modificaci\u00f3n de superficies<\/li>\n<li data-section-id=\"1b8wqpz\" data-start=\"4507\" data-end=\"4541\">Preparaci\u00f3n del revestimiento funcional<\/li>\n<\/ul>\n<hr data-start=\"4543\" data-end=\"4546\" \/>\n<h2 data-section-id=\"13lz0w7\" data-start=\"4548\" data-end=\"4591\"><span role=\"text\">Ventajas sobre el grabado convencional<\/span><\/h2>\n<div class=\"TyagGW_tableContainer\">\n<div class=\"group TyagGW_tableWrapper flex flex-col-reverse w-fit\" tabindex=\"-1\">\n<table class=\"w-fit min-w-(--thread-content-width)\" data-start=\"4593\" data-end=\"4927\">\n<thead data-start=\"4593\" data-end=\"4646\">\n<tr data-start=\"4593\" data-end=\"4646\">\n<th class=\"\" data-start=\"4593\" data-end=\"4603\" data-col-size=\"sm\">Caracter\u00edstica<\/th>\n<th class=\"\" data-start=\"4603\" data-end=\"4622\" data-col-size=\"sm\">Grabado con haz de iones<\/th>\n<th class=\"\" data-start=\"4622\" data-end=\"4646\" data-col-size=\"sm\">Grabado i\u00f3nico reactivo<\/th>\n<\/tr>\n<\/thead>\n<tbody data-start=\"4697\" data-end=\"4927\">\n<tr data-start=\"4697\" data-end=\"4746\">\n<td data-start=\"4697\" data-end=\"4712\" data-col-size=\"sm\">Tipo de proceso<\/td>\n<td data-start=\"4712\" data-end=\"4723\" data-col-size=\"sm\">F\u00edsico<\/td>\n<td data-start=\"4723\" data-end=\"4746\" data-col-size=\"sm\">F\u00edsico + Qu\u00edmico<\/td>\n<\/tr>\n<tr data-start=\"4747\" data-end=\"4805\">\n<td data-start=\"4747\" data-end=\"4765\" data-col-size=\"sm\">Exposici\u00f3n al plasma<\/td>\n<td data-start=\"4765\" data-end=\"4786\" data-col-size=\"sm\">Sin exposici\u00f3n directa<\/td>\n<td data-start=\"4786\" data-end=\"4805\" data-col-size=\"sm\">Exposici\u00f3n directa<\/td>\n<\/tr>\n<tr data-start=\"4806\" data-end=\"4853\">\n<td data-start=\"4806\" data-end=\"4829\" data-col-size=\"sm\">Selectividad del material<\/td>\n<td data-start=\"4829\" data-end=\"4845\" data-col-size=\"sm\">Bajo (uniforme)<\/td>\n<td data-start=\"4845\" data-end=\"4853\" data-col-size=\"sm\">Alta<\/td>\n<\/tr>\n<tr data-start=\"4854\" data-end=\"4893\">\n<td data-start=\"4854\" data-end=\"4871\" data-col-size=\"sm\">Da\u00f1os superficiales<\/td>\n<td data-start=\"4871\" data-end=\"4881\" data-col-size=\"sm\">M\u00ednimo<\/td>\n<td data-start=\"4881\" data-end=\"4893\" data-col-size=\"sm\">Posible<\/td>\n<\/tr>\n<tr data-start=\"4894\" data-end=\"4927\">\n<td data-start=\"4894\" data-end=\"4906\" data-col-size=\"sm\">Precisi\u00f3n<\/td>\n<td data-start=\"4906\" data-end=\"4919\" data-col-size=\"sm\">Ultra alta<\/td>\n<td data-start=\"4919\" data-end=\"4927\" data-col-size=\"sm\">Alta<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<\/div>\n<\/div>\n<hr data-start=\"4929\" data-end=\"4932\" \/>\n<h2 data-section-id=\"elc90z\" data-start=\"4934\" data-end=\"4944\"><span role=\"text\">PREGUNTAS FRECUENTES<\/span><\/h2>\n<h3 data-section-id=\"1h3z74f\" data-start=\"4946\" data-end=\"4978\"><span role=\"text\">Qu\u00e9 es el grabado por haz de iones\uff1f<\/span><\/h3>\n<p data-start=\"4979\" data-end=\"5122\">El grabado por haz de iones es un proceso de grabado en seco que elimina material mediante pulverizaci\u00f3n f\u00edsica utilizando iones de alta energ\u00eda en un entorno de vac\u00edo.<\/p>\n<h3 data-section-id=\"1oyreis\" data-start=\"5124\" data-end=\"5153\"><span role=\"text\">Diferencia entre OIE y RIE\uff1f<\/span><\/h3>\n<ul data-start=\"5154\" data-end=\"5316\">\n<li data-section-id=\"6o7nxe\" data-start=\"5154\" data-end=\"5219\">OIE: puramente f\u00edsica, sin contacto con el plasma, mayor precisi\u00f3n<\/li>\n<li data-section-id=\"d79ynl\" data-start=\"5220\" data-end=\"5316\">RIE: combina reacciones qu\u00edmicas con plasma, mayor selectividad pero m\u00e1s riesgo de da\u00f1os.<\/li>\n<\/ul>","protected":false},"excerpt":{"rendered":"<p>La m\u00e1quina de grabado por haz de iones para Si, SiO2 y materiales met\u00e1licos es un sistema de grabado en seco de alta precisi\u00f3n dise\u00f1ado para aplicaciones avanzadas de microfabricaci\u00f3n y nanotecnolog\u00eda. Utilizando el grabado por haz de iones (IBE), tambi\u00e9n conocido como fresado i\u00f3nico, este equipo permite eliminar gran cantidad de material mediante un proceso de pulverizaci\u00f3n cat\u00f3dica puramente 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